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Reliability of Microtechnology
Hoofdkenmerken
Auteur: Johan Liu; Olli Salmela; Jussi Sarkka; James E. Morris; Per-Erik Tegehall; Cristina Andersson
Titel: Reliability of Microtechnology
Uitgever: Springer Nature
ISBN: 9781441957603
ISBN boekversie: 9781441957597
Prijs: € 167,85
Verschijningsdatum: 07-02-2011
Inhoudelijke kenmerken
Categorie: General
Taal: English
Imprint: Springer
Technische kenmerken
Verschijningsvorm: E-book
 

Inhoudsopgave:

Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail. The book also includes exercises and detailed solutions at the end of each chapter.
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