Nederlands
  nl
English
  en
contact veelgestelde vragen
log in
VU
 
Characterization, Testing, Measurement, and Metrology
Hoofdkenmerken
Auteur: J. Paulo Davim; Sunpreet Singh; Chander Prakash
Titel: Characterization, Testing, Measurement, and Metrology
Uitgever: Taylor & Francis
ISBN: 9781000193350
ISBN boekversie: 9780367554941
Editie: 1
Prijs: € 92,31
Verschijningsdatum: 25-10-2020
Inhoudelijke kenmerken
Categorie: Manufacturing
Taal: English
Imprint: CRC Press
Technische kenmerken
Verschijningsvorm: E-book
 

Inhoudsopgave:

This book presents the broad aspects of measurement, performanceanalysis, and characterization for materials and devices through advanced manufacturing processes. The field of measurement and metrology as a precondition for maintaining high-quality products, devices, and systems in materials and advanced manufacturing process applications has grown substantially in recent years. The focus of this book is to present smart materials in numerous technological sectors such as automotive, bio-manufacturing, chemical, electronics, energy, and construction. Advanced materials have novel properties and therefore must be fully characterized and studied in-depth so they can be incorporated into products that will outperform existing products and resolve current problems. The book captures the emerging areas of materials science and advanced manufacturing engineering and presents recent trends in research for researchers, field engineers, and academic professionals.
leveringsvoorwaarden privacy statement copyright disclaimer veelgestelde vragen contact
 
Welkom bij SALUS