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Hoofdkenmerken

Auteur:	Zalevsky, Zeev
Titel:	New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices
Uitgever:	William Andrew Publishing
ISBN:	9780323241434
Serie:	Micro & Nano Technologies
Land van oorsprong:	United States
Prijs:	€ 41,13
Verschijningsdatum:	20-11-2013
Bericht:	Langere levertijd (2-3 weken)

Inhoudelijke kenmerken

Leesniveau:	Professional & Vocational
Categorie:	Imaging systems & technology
Dewey code:	621.367

Technische kenmerken

Verschijningsvorm:	Paperback / softback
Paginas:	110
Hoogte mm.:	228
Breedte mm.:	151
Dikte mm.:	5
Gewicht gr.:	198

 

Inhoud:

Introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. This book presents novel """"smart"""" image processing methods, applications, and case studies concerning quality improvement of microscope images of microelectronic chips and process optimization.