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Hoofdkenmerken

Auteur:	Adams, Daniel; Alford, Terry
Titel:	Silver Metallization Stability and Reliability
Uitgever:	Springer London Ltd
ISBN:	9781849967051
Serie:	Engineering Materials and
Editie:	2008
Land van oorsprong:	United Kingdom
Prijs:	€ 124.44
Verschijningsdatum:	16-12-2011
Bericht:	Langere levertijd (2-3 weken)

Inhoudelijke kenmerken

Leesniveau:	Professional & Vocational
Categorie:	Production engineering
Geillustreerd:	10 Tables, black and white; 66 Illustrations, black and white; XII, 123 p. 66 illus.

Technische kenmerken

Verschijningsvorm:	Paperback / softback
Paginas:	123
Hoogte mm.:	235
Breedte mm.:	155
Gewicht gr.:	219

 

Inhoud:

Here is the first book to discuss the current understanding of silver metallization and its potential as a future interconnect material for integrated circuit technology. With the lowest resistivity of all metals, silver is an attractive interconnect material for higher current densities and faster switching speeds in integrated circuits.